Measurement of the conductivity for metal thin films at microwave and millimeter-wave frequencies - Balanced-type circular disk resonator method (IEC 63616:2025); German version EN IEC 63616:2026

Draft standard [PRE-ORDER]

DIN EN IEC 63616:2026-07 - Draft

VDE 0887-969-73:2026-07

Measurement of the conductivity for metal thin films at microwave and millimeter-wave frequencies - Balanced-type circular disk resonator method (IEC 63616:2025); German version EN IEC 63616:2026

German title
Messung der Leitfähigkeit von Metalldünnschichten bei Mikrowellen- und Millimeterwellenfrequenzen nach dem symmetrischen Kreisscheibenresonatorverfahren (IEC 63616:2025); Deutsche Fassung EN IEC 63616:2026
Date of issue
2026-06-26
Publication date
2026-07
Original language
German
Pages
13

20.08 EUR VAT included

18.77 EUR VAT excluded

Format and language options

Shipment (3-5 working days)

  • 20.08 EUR

Monitor with the Standards Ticker

This option is only available after login.
1

preorderable

Easily subscribe: Save time and money now!

You can also subscribe to this document - together with other important standards in your industry. This makes your work easier and pays for itself after a short time.

Sparschwein_data
Subscription advantages
Sparschwein Vorteil 1_data

Important standards for your industry, regularly updated

Sparschwein Vorteil 2_data

Much cheaper than buying individually

Sparschwein Vorteil 3_data

Useful functions: Filters, version comparison and more

Date of issue
2026-06-26
Publication date
2026-07
Original language
German
Pages
13
Loading recommended items...

Product information on this site:

Quick delivery via download or delivery service

Buy securely with a credit card or pay upon receipt of invoice

All transactions are encrypted

Cooperation at DIN

Loading recommended items...