Semiconductor devices - Mechanical and climatic test methods - Part 23: High temperature operating life (IEC 47/2881/CDV) (english version)

Draft standard

OVE EN IEC 60749-23:2025-01-01 - Draft

Semiconductor devices - Mechanical and climatic test methods - Part 23: High temperature operating life (IEC 47/2881/CDV) (english version)

German title
Halbleiterbauelemente - Mechanische und klimatische Prüfverfahren - Teil 23: Lebensdauer bei hoher Temperatur (IEC 47/2881/CDV) (englische Fassung)
Publication date
2025-01-01
Original language
English
Pages
14

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Publication date
2025-01-01
Original language
English
Pages
14
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