Measurement of the complex permittivity for low-loss dielectric substrates balanced-type circular disk resonator method (IEC 46F/672/CDV) (english version)

Draft standard

OVE EN IEC 63185:2024-07-01 - Draft

Measurement of the complex permittivity for low-loss dielectric substrates balanced-type circular disk resonator method (IEC 46F/672/CDV) (english version)

German title
Messung der komplexen Dielektrizitätskonstante für verlustarme dielektrische Substrate nach dem symmetrischen Kreisscheibenresonatorverfahren (IEC 46F/672/CDV) (englische Fassung)
Publication date
2024-07-01
Original language
English
Pages
18

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Publication date
2024-07-01
Original language
English
Pages
18
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