Testing of ceramic raw materials and ceramic materials - Direct determination of mass fractions of trace impurities in powders, granules and lumps of graphite by optical emission spectroscopy by inductively coupled plasma (ICP-OES) and by electrothermal vaporization (ETV) under the action of a halogenated reaction gas (modifier)
This document specifies a method for determining the mass fractions of the impurities Ag, Al, As, B, Ba, Be, Bi, Ca, Cd, Co, Cr, Cu, Fe, K, Li, Mg, Mn, Mo, Na, Ni, P, Pb, S, Sb, Si, Sn, Sr, Ti, V ...