Dear customers,

Currently, the printing and shipping of print documents (standards and regulations) are delayed.
If available, you may also order the document in digital download format; it is usually available within a few minutes (or within one business day at the latest if manual review is required).
To convert an existing order, please email international@dinmedia.de, including your order number or customer number.
We apologize for the inconvenience and thank you for your patience.

Your DIN Media

Standard Test Method for Particle Size Distribution of Advanced Ceramics by X-Ray Monitoring of Gravity Sedimentation

Standard [CURRENT]

ASTM C 1730:2017

Standard Test Method for Particle Size Distribution of Advanced Ceramics by X-Ray Monitoring of Gravity Sedimentation

Publication date
2017 reapproved: 2022
Original language
English
Pages
4

from 68.50 EUR VAT included

from 64.02 EUR VAT excluded

Format and language options

PDF download 1
  • 68.50 EUR

Shipment (3-5 working days)
  • 76.20 EUR

Monitor with the Standards Ticker

This option is only available after login.
1

Document with DRM – more on DRM

Easily subscribe: Save time and money now!

You can also subscribe to this document - together with other important standards in your industry. This makes your work easier and pays for itself after a short time.

Sparschwein_data
Subscription advantages
Sparschwein Vorteil 1_data

Important standards for your industry, regularly updated

Sparschwein Vorteil 2_data

Much cheaper than buying individually

Sparschwein Vorteil 3_data

Useful functions: Filters, version comparison and more

Publication date
2017 reapproved: 2022
Original language
English
Pages
4
DOI
https://dx.doi.org/10.1520/C1730-17R22

Quick delivery via download or delivery service

Buy securely with a credit card or pay upon receipt of invoice

All transactions are encrypted

Short description

1.1 This test method covers the determination of particle size distribution of advanced ceramic powders. Experience has shown that this test method is satisfactory for the analysis of silicon carbide, silicon nitride, and zirconium oxide in the size range of 0.1 up to 50 µm.

ICS

81.060.30

DOI

https://dx.doi.org/10.1520/C1730-17R22
Also available in
Loading recommended items...
Loading recommended items...
Loading recommended items...
Loading recommended items...