Semiconductor devices. Mechanical and climatic test methods. Mechanical shock. device and subassembly

Standard [CURRENT]

BS EN IEC 60749-10:2022-08-16

Semiconductor devices. Mechanical and climatic test methods. Mechanical shock. device and subassembly

German title
Halbleiterbauelemente. Mechanische und klimatische Prüfverfahren Mechanischer Schock. Bauelemente und Unterbaugruppe
Publication date
2022-08-16
Original language
English
Pages
16

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Publication date
2022-08-16
Original language
English
Pages
16

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