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Semiconductor devices - Mechanical and climatic test methods - Part 2: Low air pressure (IEC 60749-2:2002); German version EN 60749-2:2002

Standard [CURRENT]

DIN EN 60749-2:2003-04

Semiconductor devices - Mechanical and climatic test methods - Part 2: Low air pressure (IEC 60749-2:2002); German version EN 60749-2:2002

German title
Halbleiterbauelemente - Mechanische und klimatische Prüfverfahren - Teil 2: Niedriger Luftdruck (IEC 60749-2:2002); Deutsche Fassung EN 60749-2:2002
Publication date
2003-04
Original language
German
Pages
8
Note
The publisher recommends this document in lieu of the withdrawn document DIN 41881-2:1978-06 , for which no replacement is available.

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Publication date
2003-04
Original language
German
Pages
8
Note
The publisher recommends this document in lieu of the withdrawn document DIN 41881-2:1978-06 , for which no replacement is available.
DOI
https://dx.doi.org/10.31030/9451323

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ICS

31.080.01

DOI

https://dx.doi.org/10.31030/9451323
Replacement amendments

This document replaces DIN EN 60749:2002-09 .

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