DIN EN 62132-1:2016-09

Measurements of injected voltages and currents - in conjunction with the response of integrated circuits (IC) tested under controlled conditions - provide information on the potential immunity of an IC to conducted and radiated radio-frequency disturbances for a particular application. This document describes general conditions required to obtain consistent quantitative measurements of IC immunity. Critical parameters to be expected and parameters affecting the measurement results are described in this document. Deviations from this document shall be described in the corresponding measurement report. The measurement results can be used for comparative as well as other purposes. This part of IEC 62132 provides general information and definitions about measurement of electromagnetic immunity of integrated circuits (ICs) to conducted and radiated disturbances. It also defines general test conditions, test equipment and setup, as well as the test procedures and content of the test reports for all parts of the IEC 62132 series. Test method comparison tables are included in Annex A to assist in selecting the appropriate measurement method(s). The responsible committee is DKE/K 631 "Halbleiterbauelemente" ("Semiconductor devices") of the DKE (German Commission for Electrical, Electronic and Information Technologies) at DIN and VDE.