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Standard [CURRENT]

DIN EN IEC 60749-41:2023-03

Semiconductor devices - Mechanical and climatic test methods - Part 41: Standard reliability testing methods of non-volatile memory devices (IEC 60749-41:2020); German version EN IEC 60749-41:2020

German title
Halbleiterbauelemente - Mechanische und klimatische Prüfverfahren - Teil 41: Standardisierte Prüfverfahren für die Zuverlässigkeit von nichtflüchtigen Speicher-Bauelementen (IEC 60749-41:2020); Deutsche Fassung EN IEC 60749-41:2020
Publication date
2023-03
Original language
German
Pages
26

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Publication date
2023-03
Original language
German
Pages
26
DOI
https://dx.doi.org/10.31030/3370242

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ICS
31.080.01
DOI
https://dx.doi.org/10.31030/3370242

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