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This International Standard specifies a method for the determination of the film thickness of a fine ceramic film and ceramic coatings by a contact-probe profilometer. The method is suitable for film thicknesses in the range of 10 nm to 10 000 nm. The text of ISO 18452:2005 has been prepared by Technical Committee ISO/TC 206 "Fine ceramics" of the International Organization for Standardization (ISO) and adopted as EN ISO 18452:2016 by CEN/TC 184 "Advanced technical ceramics", the secretariat of which is held by DIN (Germany). There is no DIN working committee for DIN EN ISO 18452, as no interest in this standardization topic has been expressed by the German technical public.
This document replaces DIN EN 1071-1:2003-06 .