Semiconductor devices - Mechanical and climatic test methods - Part 33: accelerated moisture resistance - unbiased autoclave

Standard [CURRENT]

NF C96-022-33:2005-12-01

NF EN 60749-33:2005-12-01

Semiconductor devices - Mechanical and climatic test methods - Part 33: accelerated moisture resistance - unbiased autoclave

German title
Halbleiterbauelemente - Mechanische und klimatische Prüfverfahren - Teil 33: beschleunigte Verfahren für Feuchtebeständigkeit - Autoclave ohne elektrische Beanspruchung
Publication date
2005-12-01
Original language
English, French
Pages
12

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Publication date
2005-12-01
Original language
English, French
Pages
12
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