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Standard [CURRENT]

OVE EN IEC 63287-2:2024-11-01

Semiconductor devices - Guidelines for reliability qualification plans - Part 2: Concept of mission profile (( IEC 63287-2:2023) EN IEC 63287-2:2023) (german version)

German title
Halbleiterbauelemente - Richtlinien für Zuverlässigkeitsqualifizierungspläne - Teil 2: Konzept des Einsatzprofils (( IEC 63287-2:2023) EN IEC 63287-2:2023) (deutsche Fassung)
Publication date
2024-11-01
Original language
German
Pages
20

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Publication date
2024-11-01
Original language
German
Pages
20

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