Measurement of Radiated Emissions from Integrated Circuits -Surface Scan Method (Loop Probe Method) 10 MHz to 3 GHz

Standard [CURRENT]

SAE J 1752/2:2016-09-16

Measurement of Radiated Emissions from Integrated Circuits -Surface Scan Method (Loop Probe Method) 10 MHz to 3 GHz

Publication date
2016-09-16
Original language
English
Pages
10

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Publication date
2016-09-16
Original language
English
Pages
10

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