Standard
[CURRENT]
UNE-EN 60749-14:2004-06-11
Semiconductor devices - Mechanical and climatic test methods - Part 14: Robustness of terminations (lead integrity)
- Publication date
-
2004-06-11
- Original language
-
Spanish
- Pages
- 15
- Publication date
-
2004-06-11
- Original language
-
Spanish
- Pages
- 15
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