Dear customers,

Due to the public holiday, we are not available in person today.

Registrations and manually processed orders cannot be handled during this period. However, our webshop remains available for orders and downloads at any time.

From tomorrow onward, we will be happy to assist you again as usual.

You can also find many helpful answers and resources in our FAQ section at any time.

Your DIN Media GmbH

X-ray optical systems - X-ray mirrors - Total reflection mirrors and multilayer mirrors

Technical rule [WITHDRAWN]

VDI/VDE 5575 Blatt 4:2011-08

X-ray optical systems - X-ray mirrors - Total reflection mirrors and multilayer mirrors

German title
Röntgenoptische Systeme - Röntgenspiegel - Totalreflexions- und Multischichtspiegel
Publication date
2011-08
Original language
German, English
Pages
19

from 81.50 EUR VAT included

from 76.17 EUR VAT excluded

Format and language options

PDF download 1

  • 81.50 EUR

Shipment (3-5 working days) 1

  • 90.60 EUR

Monitor with the Standards Ticker

1

 Attention: Document withdrawn!

Easily subscribe: Save time and money now!

You can also subscribe to this document - together with other important standards in your industry. This makes your work easier and pays for itself after a short time.

Sparschwein_data
Subscription advantages
Sparschwein Vorteil 1_data

Important standards for your industry, regularly updated

Sparschwein Vorteil 2_data

Much cheaper than buying individually

Sparschwein Vorteil 3_data

Useful functions: Filters, version comparison and more

Publication date
2011-08
Original language
German, English
Pages
19
Loading recommended items...

Product information on this site:

Quick delivery via download or delivery service

Buy securely with a credit card or pay upon receipt of invoice

All transactions are encrypted

Short description

This guideline deals with reflective X-ray optical systems, which use total reflection as well as Bragg reflection on inner interfaces of a multilayer structure to influence the spectral composition and the directional characteristic. The physical principles and determining parameters of these X-ray mirrors are described. The role and influence of substrate and coatings are explained. Total reflection mirrors and multilayer mirrors for various applications are discussed. The most important X-ray optical systems using X-ray mirrors (Kirkpatrick-Baez, Wolter, Schwarzschild, Montel und EUVL optics) are introduced briefly.

Content

ICS

17.180.30
Replacement amendments

This document has been replaced by: VDI/VDE 5575 Blatt 4:2018-09 .

Also available in
Loading recommended items...