Microbeam analysis - Analytical electron microscopy - Procedures for determining the point resolution of high-resolution transmission electron microscopes

Draft standard

ISO/FDIS 25387:2026-03 - Draft

Microbeam analysis - Analytical electron microscopy - Procedures for determining the point resolution of high-resolution transmission electron microscopes

German title
Mikrobereichsanalyse - Analytische Elektronenmikroskopie - Verfahren zur Bestimmung der Punktauflösung eines hochauflösenden Transmissionselektronenmikroskops
Publication date
2026-03
Original language
English
Pages
52

from 233.60 EUR VAT included

from 218.32 EUR VAT excluded

Format and language options

PDF download

  • 233.60 EUR

Shipment (3-5 working days)

  • 263.90 EUR

Monitor with the Standards Ticker

This option is only available after login.
Easily subscribe: Save time and money now!

You can also subscribe to this document - together with other important standards in your industry. This makes your work easier and pays for itself after a short time.

Sparschwein_data
Subscription advantages
Sparschwein Vorteil 1_data

Important standards for your industry, regularly updated

Sparschwein Vorteil 2_data

Much cheaper than buying individually

Sparschwein Vorteil 3_data

Useful functions: Filters, version comparison and more

Publication date
2026-03
Original language
English
Pages
52

Product information on this site:

Quick delivery via download or delivery service

Buy securely with a credit card or pay upon receipt of invoice

All transactions are encrypted

Replacement amendments

This document replaces ISO/DIS 25387:2025-07 .

Cooperation at DIN

Loading recommended items...
Loading recommended items...
Loading recommended items...
Loading recommended items...