Testing of semiconductor materials; determination of the radial resistivity variation of silicon or germanium slices by means of the four-probe/direct current method

Standard [WITHDRAWN]

DIN 50435:1988-05

Testing of semiconductor materials; determination of the radial resistivity variation of silicon or germanium slices by means of the four-probe/direct current method

German title
Prüfung von Materialien für die Halbleitertechnologie; Bestimmung der radialen Variation des spezifischen elektrischen Widerstandes an Silicium- oder Germanium-Scheiben mit dem Vier-Sonden-Gleichstromverfahren
Publication date
1988-05
Original language
German
Pages
3

from 36.70 EUR VAT included

from 34.30 EUR VAT excluded

Format and language options

PDF download 1

  • 36.70 EUR

  • 46.10 EUR

Shipment (3-5 working days) 1

  • 47.20 EUR

  • 58.80 EUR

Monitor with the Standards Ticker

1

 Attention: Document withdrawn!

Easily subscribe: Save time and money now!

You can also subscribe to this document - together with other important standards in your industry. This makes your work easier and pays for itself after a short time.

Sparschwein_data
Subscription advantages
Sparschwein Vorteil 1_data

Important standards for your industry, regularly updated

Sparschwein Vorteil 2_data

Much cheaper than buying individually

Sparschwein Vorteil 3_data

Useful functions: Filters, version comparison and more

Publication date
1988-05
Original language
German
Pages
3
Loading recommended items...

Product information on this site:

Quick delivery via download or delivery service

Buy securely with a credit card or pay upon receipt of invoice

All transactions are encrypted

Replacement amendments

This document replaces DIN 50435:1980-02 .

Cooperation at DIN

Relationship to other standards
This document references:
Loading recommended items...