Standard [AVAILABLE PRE-PUBLICATION]

DIN EN IEC 60749-34-1:2026-07

Semiconductor devices - Mechanical and climatic test methods - Part 34-1: Power cycling test for power semiconductor module (IEC 60749-34-1:2025); German version EN IEC 60749-34-1:2025

German title: Halbleiterbauelemente - Mechanische und klimatische Prüfverfahren - Teil 34-1: Leistungszyklusprüfung für Leistungshalbleitermodule (IEC 60749-34-1:2025); Deutsche Fassung EN IEC 60749-34-1:2025
Publication date: 2026-07
Original language: German
Pages: 29

from 124.80 EUR VAT included

from 116.64 EUR VAT excluded

Format and language options

PDF download

Shipment (3-5 working days)

Monitor with the Standards Ticker

This option is only available after login.

Loading recommended items...

Product information on this site:

Quick delivery via download or delivery service

Buy securely with a credit card or pay upon receipt of invoice

All transactions are encrypted

31.080.01

https://dx.doi.org/10.31030/3684939

Replacement amendments

And replaced by 2026-07 for:: DIN EN IEC 60749-34-1:2024-08 .

Document timeline

PRE-PUBLISHED

2026-07

Standard [AVAILABLE PRE-PUBLICATION]

DIN EN IEC 60749-34-1:2026-07

Drafts

2024-08 - 2026-07

Draft standard

Loading recommended items...