Semiconductor devices - Mechanical and climatic test methods - Part 34-1: Power cycling test for power semiconductor module (IEC 60749-34-1:2025); German version EN IEC 60749-34-1:2025

Standard [NEW]

DIN EN IEC 60749-34-1:2026-07

Semiconductor devices - Mechanical and climatic test methods - Part 34-1: Power cycling test for power semiconductor module (IEC 60749-34-1:2025); German version EN IEC 60749-34-1:2025

German title
Halbleiterbauelemente - Mechanische und klimatische Prüfverfahren - Teil 34-1: Leistungszyklusprüfung für Leistungshalbleitermodule (IEC 60749-34-1:2025); Deutsche Fassung EN IEC 60749-34-1:2025
Publication date
2026-07
Accessibility
Original language
German
Pages
29

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Publication date
2026-07
Original language
German
Pages
29
DOI
https://dx.doi.org/10.31030/3684939
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ICS

31.080.01

DOI

https://dx.doi.org/10.31030/3684939
Replacement amendments
Document timeline
CURRENT STANDARD
2026-07 - 2026-07

Standard [NEW]

DIN EN IEC 60749-34-1:2026-07
WITHDRAWN
2024-08 - 2026-07

Draft standard [WITHDRAWN]

DIN EN IEC 60749-34-1:2024-08

Cooperation at DIN

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