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IEC 60749-23:2025-12

Semiconductor devices - Mechanical and climatic test methods - Part 23: High temperature operating life

German title
Halbleiterbauelemente - Mechanische und klimatische Prüfverfahren - Teil 23: Lebensdauer bei hoher Temperatur
Publication date
2025-12
Original language
English, French
Pages
19
Publication date
2025-12
Original language
English, French
Pages
19
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