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Standard [CURRENT] Article is not orderable

IEC 60749-29:2011-04

Semiconductor devices - Mechanical and climatic test methods - Part 29: Latch-up test

German title
Halbleiterbauelemente - Mechanische und klimatische Prüfverfahren - Teil 29: Latch-up-Prüfung
Publication date
2011-04
Original language
English, French
Pages
48
Publication date
2011-04
Original language
English, French
Pages
48
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