Testing of materials for semiconductor technology - Determination of impurity content in semiconductors by infrared absorption - Part 2: Boron in gallium arsenide

Draft standard [WITHDRAWN]

DIN 50449-2:1996-02 - Draft

Testing of materials for semiconductor technology - Determination of impurity content in semiconductors by infrared absorption - Part 2: Boron in gallium arsenide

German title
Prüfung von Materialien für die Halbleitertechnologie - Bestimmung des Verunreinigungsgehaltes in III-V-Verbindungshalbleitern mittels Infrarotabsorption - Teil 2: Bor in Galliumarsenid
Publication date
1996-02
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Original language
German
Pages
6

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Publication date
1996-02
Original language
German
Pages
6
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This document has been replaced by: DIN 50449-2:1998-01 .

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