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Single crystal wafers for surface acoustic wave (SAW) device applications - Specifications and measuring methods (IEC 49/1401/CD:2022); Text in German and English

Draft standard [WITHDRAWN]

DIN EN IEC 62276:2023-05 - Draft

Single crystal wafers for surface acoustic wave (SAW) device applications - Specifications and measuring methods (IEC 49/1401/CD:2022); Text in German and English

German title
Einkristall-Wafer für Oberflächenwellen-(OFW-)Bauelemente - Festlegungen und Messverfahren (IEC 49/1401/CD:2022); Text Deutsch und Englisch
Date of issue
2023-04-28
Publication date
2023-05
Original language
German, English
Pages
91

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Date of issue
2023-04-28
Publication date
2023-05
Original language
German, English
Pages
91
DOI
https://dx.doi.org/10.31030/3428642

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ICS

31.140

DOI

https://dx.doi.org/10.31030/3428642
Replacement amendments

This document has been replaced by: DIN EN IEC 62276:2026-03 .

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