Single crystal wafers for surface acoustic wave (SAW) device applications - Specifications and measuring methods (IEC 62276:2025); German version EN IEC 62276:2025

Standard [NEW]

DIN EN IEC 62276:2026-03

Single crystal wafers for surface acoustic wave (SAW) device applications - Specifications and measuring methods (IEC 62276:2025); German version EN IEC 62276:2025

German title
Einkristall-Wafer für Oberflächenwellen-(OFW-)Bauelemente - Festlegungen und Messverfahren (IEC 62276:2025); Deutsche Fassung EN IEC 62276:2025
Publication date
2026-03
Original language
German
Pages
44

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Publication date
2026-03
Original language
German
Pages
44
DOI
https://dx.doi.org/10.31030/3666970
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ICS

31.140

DOI

https://dx.doi.org/10.31030/3666970
Replacement amendments

This document replaces DIN EN 62276:2017-08 .

Document timeline
CURRENT STANDARD
2026-03 - 2026-03

Standard [NEW]

DIN EN IEC 62276:2026-03
WITHDRAWN
2023-05 - 2026-03

Draft standard [WITHDRAWN]

DIN EN IEC 62276:2023-05
2017-08 - 2026-03

Standard [WITHDRAWN]

DIN EN 62276:2017-08

Cooperation at DIN

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