Microbeam analysis - Analytical electron microscopy - Guidelines for transmission electron microscopy specimen preparation by lift-out method using focused ion beam system

Draft standard

ISO/DIS 16887:2026-03 - Draft

Microbeam analysis - Analytical electron microscopy - Guidelines for transmission electron microscopy specimen preparation by lift-out method using focused ion beam system

German title
Mikrobereichsanalyse – Analytische Elektronenmikroskopie – Leitfäden zur Probenpräparation für die Transmissionselektronenmikroskopie mittels Lift-out-Methode unter Verwendung eines fokussierten Ionenstrahlsystems
Publication date
2026-03
Original language
English
Pages
24

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Publication date
2026-03
Original language
English
Pages
24

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