Photovoltaic (PV) modules - Type approval, design and safety qualification - Retesting (IEC TS 62915:2023)

Pre-standard

DIN IEC/TS 62915:2025-12

VDE V 0126-75:2025-12

Photovoltaic (PV) modules - Type approval, design and safety qualification - Retesting (IEC TS 62915:2023)

German title
Photovoltaik(PV)-Module - Bauartzulassung, Bauarteignung und Sicherheitsqualifizierung - Wiederholungsprüfung (IEC TS 62915:2023)
Publication date
2025-12
Accessibility
Original language
German
Pages
44
Procedure
Pre-Standard

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Publication date
2025-12
Original language
German
Pages
44
Procedure
Pre-Standard
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Overview

This document sets forth a uniform approach to maintain type approval, design and safety qualification of terrestrial PV modules that have undergone or will undergo modification from their originally assessed design. This document addresses two types of PV module technologies, wafer-based technologies (WBT) and monolithically-integrated (MLI) thin-film based technologies. There are no restrictions on the scope of this document. The standard differs from DIN IEC/TS 62915 (VDE V 0126-75):2021-06 as follows: a) - prior references to specific process-related changes to PV modules have been removed in this edition and replaced with a general requirement to ensure that a consistent quality management system is in place per IEC 62941; b) references to IEC 61215 and IEC 61730 have been updated to the latest editions (2021 and 2023 respectively; c) retest requirements with respect to new added tests such as cyclic (dynamic) mechanical load (MQT 20) and potential-induced degradation (MQT 21) are addressed in this edition; d) retest requirements for IEC 61215 and IEC 61730 have been separated for the sake of clarity; e) a comprehensive matrix table summarizing all the retest requirements for each possible change in material(s) or design modification is provided in this edition; f) references to component level standards, namely IEC 62788-1 series and IEC 62788-2 series, are included in this edition to address changes that could be made to the critical sub-components going into new PV module constructions; g) crystalline silicon and thin film references have been updated to be consistent with nomenclature in the updated IEC 61215 and IEC 61730 standards; namely, wafer-based technology (WBT) and monolithically integrated (MLI) thin film PV modules; h) in this edition subclause 4.3 which addresses retest requirements for MLI thin film PV modules has been truncated and simplified by removing redundant sections that are identical with the subclauses in 4.2 Guidance for retesting modules according to IEC TS 63126, "Guidelines for qualifying PV modules, components and materials for operation at high temperatures" has been added to this edition; j) in this edition, requirements have been added for changes affecting system compatibility with variants of the same model. Changes in material selection, components, and the manufacturing process may affect the electrical performance, reliability, and safety of the modified products. This document lists typical changes and the resulting requirements for retesting based on various test standards. It provides support, but at a certain level, technical judgment may be required. The test sequences have been selected to identify adverse changes to the product. It is assumed that products that successfully complete the test sequences specified here comply with the standards against which they were evaluated during their initial qualification. The number of test specimens to be included in the retesting program and the acceptance/rejection criteria are specified in the referenced standards IEC 61215 and IEC 61730. In addition, representative test specimens as described in IEC 61215 and IEC 61730, as applicable, may be used.

Replacement amendments

Cooperation at DIN

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