Testing of semiconductor materials; measurement of the resistivity of silicon or germanium single crystals by means of the four probe/direct current method with collinear array

Standard [WITHDRAWN]

DIN 50431:1988-05

Testing of semiconductor materials; measurement of the resistivity of silicon or germanium single crystals by means of the four probe/direct current method with collinear array

German title
Prüfung von Materialien für die Halbleitertechnologie; Messung des spezifischen elektrischen Widerstandes von Einkristallen aus Silicium oder Germanium mit dem Vier-Sonden-Gleichstrom-Verfahren bei linearer Anordnung der Sonden
Publication date
1988-05
Original language
German
Pages
5

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Publication date
1988-05
Original language
German
Pages
5

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Replacement amendments

This document replaces DIN 50431:1980-09 .

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