Testing of semi-conducting inorganic materials; measurement of the electrical resistivity of silicon or germanium single crystals by means of the four-point-probe direct current method with collinear four probe array

Standard [WITHDRAWN]

DIN 50431:1980-09

Testing of semi-conducting inorganic materials; measurement of the electrical resistivity of silicon or germanium single crystals by means of the four-point-probe direct current method with collinear four probe array

German title
Prüfung halbleitender anorganischer Stoffe; Messung des spezifischen elektrischen Widerstandes von Einkristallen aus Silicium oder Germanium mit dem Vier-Sonden-Gleichstrom-Verfahren bei linearer Anordnung der Sonden
Publication date
1980-09
Original language
German
Pages
5

from 35.60 EUR VAT included

from 33.27 EUR VAT excluded

Format and language options

PDF download 1

  • 35.60 EUR

Shipment (3-5 working days) 1

  • 44.50 EUR

Monitor with the Standards Ticker

1

 Attention: Document withdrawn!

Easily subscribe: Save time and money now!

You can also subscribe to this document - together with other important standards in your industry. This makes your work easier and pays for itself after a short time.

Sparschwein_data
Subscription advantages
Sparschwein Vorteil 1_data

Important standards for your industry, regularly updated

Sparschwein Vorteil 2_data

Much cheaper than buying individually

Sparschwein Vorteil 3_data

Useful functions: Filters, version comparison and more

Publication date
1980-09
Original language
German
Pages
5

Product information on this site:

Quick delivery via download or delivery service

Buy securely with a credit card or pay upon receipt of invoice

All transactions are encrypted

Replacement amendments

This document has been replaced by: DIN 50431:1988-05 .

Cooperation at DIN

Relationship to other standards
This document references:
This document is referenced in:
Loading recommended items...
Loading recommended items...
Loading recommended items...
Loading recommended items...