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Measurement of quartz crystal unit parameters by zero phase technique in a pi-network - Part 2: Phase offset method for measurement of motional capacitance of quartz crystal units (IEC 60444-2:1980); German version EN 60444-2:1997

Standard [CURRENT]

DIN EN 60444-2:1997-10

Measurement of quartz crystal unit parameters by zero phase technique in a pi-network - Part 2: Phase offset method for measurement of motional capacitance of quartz crystal units (IEC 60444-2:1980); German version EN 60444-2:1997

German title
Messung von Schwingquarz-Parametern nach dem Null-Phasenverfahren in einem Pi-Netzwerk - Teil 2: Messung der dynamischen Kapazität von Schwingquarzen nach dem Phasenoffsetverfahren (IEC 60444-2:1980); Deutsche Fassung EN 60444-2:1997
Publication date
1997-10
Original language
German
Pages
10

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Publication date
1997-10
Original language
German
Pages
10
DOI
https://dx.doi.org/10.31030/7400982

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ICS

31.140

DOI

https://dx.doi.org/10.31030/7400982
Replacement amendments

This document replaces DIN IEC 60444-2:1992-11 .

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