Connectors for electronic equipment - Tests and measurements - Part 24-1: Magnetic interference tests - Test 24a: Residual magnetism (IEC 60512-24-1:2010); German version EN 60512-24-1:2012

Standard [CURRENT]

DIN EN 60512-24-1:2013-05

VDE 0687-512-24-1:2013-05

Connectors for electronic equipment - Tests and measurements - Part 24-1: Magnetic interference tests - Test 24a: Residual magnetism (IEC 60512-24-1:2010); German version EN 60512-24-1:2012

German title
Steckverbinder für elektronische Einrichtungen - Mess- und Prüfverfahren - Teil 24-1: Prüfungen im magnetischen Störfeld - Prüfung 24a: Restmagnetismus (IEC 60512-24-1:2010); Deutsche Fassung EN 60512-24-1:2012
Publication date
2013-05
Original language
German
Pages
6

22.30 EUR VAT included

20.84 EUR VAT excluded

Format and language options

Shipment (3-5 working days)

  • 22.30 EUR

Monitor with the Standards Ticker

This option is only available after login.
Easily subscribe: Save time and money now!

You can also subscribe to this document - together with other important standards in your industry. This makes your work easier and pays for itself after a short time.

Sparschwein_data
Subscription advantages
Sparschwein Vorteil 1_data

Important standards for your industry, regularly updated

Sparschwein Vorteil 2_data

Much cheaper than buying individually

Sparschwein Vorteil 3_data

Useful functions: Filters, version comparison and more

Publication date
2013-05
Original language
German
Pages
6
Loading recommended items...

Product information on this site:

Quick delivery via download or delivery service

Buy securely with a credit card or pay upon receipt of invoice

All transactions are encrypted

Overview

The DIN EN 60512 series contains basic test and measurement methods for connectors for electronic equipment. This standard describes a test method for measurement of the residual magnetism of a connector after exposure to a specified magnetic field. The responsible committee is DKE/K 651 "Steckverbinder" ("Connectors") of the DKE (German Commission for Electrical, Electronic and Information Technologies) at DIN and VDE.

Cooperation at DIN

Loading recommended items...