Dear customers,

Currently, the printing and shipping of print documents (standards and regulations) are delayed.
If available, you may also order the document in digital download format; it is usually available within a few minutes (or within one business day at the latest if manual review is required).
To convert an existing order, please email international@dinmedia.de, including your order number or customer number.
We apologize for the inconvenience and thank you for your patience.

Your DIN Media

Semiconductor devices - Constant current electromigration test (IEC 62415:2010); German version EN 62415:2010

Standard [CURRENT]

DIN EN 62415:2010-12

Semiconductor devices - Constant current electromigration test (IEC 62415:2010); German version EN 62415:2010

German title
Halbleiterbauelemente - Konstantstrom-Prüfverfahren zur Elektromigration (IEC 62415:2010); Deutsche Fassung EN 62415:2010
Publication date
2010-12
Original language
German
Pages
12

from 82.60 EUR VAT included

from 77.20 EUR VAT excluded

Format and language options

PDF download

  • 82.60 EUR

Shipment (3-5 working days)

  • 105.60 EUR

Monitor with the Standards Ticker

This option is only available after login.
Easily subscribe: Save time and money now!

You can also subscribe to this document - together with other important standards in your industry. This makes your work easier and pays for itself after a short time.

Sparschwein_data
Subscription advantages
Sparschwein Vorteil 1_data

Important standards for your industry, regularly updated

Sparschwein Vorteil 2_data

Much cheaper than buying individually

Sparschwein Vorteil 3_data

Useful functions: Filters, version comparison and more

Publication date
2010-12
Original language
German
Pages
12
DOI
https://dx.doi.org/10.31030/1718571

Product information on this site:

Quick delivery via download or delivery service

Buy securely with a credit card or pay upon receipt of invoice

All transactions are encrypted

Overview

This document specifies an electromigration test on metal lines, vias and contact elements using the conventional constant current load for semiconductor devices. The background of electromigration testing as described in this procedure is based on the assumption that the entire electromigration failure time distribution stays intact when accelerated. Acceleration can be described by an activation energy and a current acceleration factor. The responsible Committee is K 631 "Halbleiterbauelemente" ("Semiconductor devices") of the DKE (German Commission for Electrical, Electronic and Information Technologies) at DIN and VDE.

ICS

31.080.01

DOI

https://dx.doi.org/10.31030/1718571

Cooperation at DIN

Relationship to other standards
This document references:
Loading recommended items...
Loading recommended items...
Loading recommended items...
Loading recommended items...