Standard [CURRENT]
DIN EN IEC 63364-1:2025-01
Semiconductor devices - Semiconductor devices for IoT system - Part 1: Test method of sound variation detection (IEC 63364-1:2022); German version EN IEC 63364-1:2023
- German title
- Halbleiterbauelemente - Halbleiterbauelemente für IoT-Systeme - Teil 1: Prüfverfahren für die Erkennung von Schallschwankungen (IEC 63364-1:2022); Deutsche Fassung EN IEC 63364-1:2023
- Publication date
- 2025-01
- Original language
- German
- Pages
- 14
- Publication date
- 2025-01
- Original language
- German
- Pages
- 14
- DOI
- https://dx.doi.org/10.31030/3576061
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Overview
This part of IEC 63364-1 provides terms, test method, and report of sound variation detection system based on IoT. It provides the evaluation method for each part of the sound variation detection system based on IoT in the block diagram, the characterization parameters, symbols, test setups and the conditions. In addition, this document defines the configuration items and criteria of standard space and firing situation for the quality evaluation measurement of sound field variation detection system with IoT. This document contains the evaluation method for each part of the sound variation detection system based on IoT in the block diagram, as well as the characterization parameters, symbols, test setups, and the conditions. In addition, this document defines the configuration items and criteria of the standard space and firing situation for the quality evaluation measurement of sound field variation detection system with IoT. There are no restrictions on the scope of application for this document. A typical application example is reporting on sound variation detection system based on IoT.