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IEC 60147-2M:1980

Essential ratings and characteristics of semiconductor devices and general principles of measuring methods. Part 2 : General principles of measuring methods.

German title
Wesentliche Grenzwerte und Kennwerte von Halbleiterbauelementen und allgemeine Grundsätze für Meßverfahren; Teil 2: Allgemeine Grundlagen für Meßverfahren; 12. Ergänzung
Publication date
1980
Accessibility
Original language
English, French
Pages
73
Publication date
1980
Original language
English, French
Pages
73
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