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IEC 60749-11:2002-04
Semiconductor devices - Mechanical and climatic test methods - Part 11: Rapid change of temperature; Two-fluid-bath method
- German title
- Halbleiterbauelemente - Mechanische und klimatische Prüfverfahren - Teil 11: Rascher Temperaturwechsel; Zweibäderverfahren
- Publication date
- 2002-04
- Original language
- English, French
- Pages
- 13
- Publication date
- 2002-04
- Original language
- English, French
- Pages
- 13
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Replacement amendments
This document has been modified by: IEC 60749-11 Corrigendum 1:2003-01,IEC 60749-11 Corrigendum 2:2003-08
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