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IEC 60749-13:2002-04

Semiconductor devices - Mechanical and climatic test methods - Part 13: Salt atmosphere

German title
Halbleiterbauelemente - Mechanische und klimatische Prüfverfahren - Teil 13: Salzatmosphäre
Publication date
2002-04
Accessibility
Original language
English, French
Pages
9
Publication date
2002-04
Original language
English, French
Pages
9
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Replacement amendments

This document has been modified by: IEC 60749-13 Corrigendum 1:2003-08

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