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IEC 60749-18:2002-12

Semiconductor devices - Mechanical and climatic test methods - Part 18: Ionizing radiation (total dose)

German title
Halbleiterbauelemente - Mechanische und klimatische Prüfverfahren - Teil 18: Ionisierende Strahlung (Gesamtdosis)
Publication date
2002-12
Accessibility
Original language
English, French
Pages
27
Publication date
2002-12
Original language
English, French
Pages
27
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