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IEC 60749-24:2005-11

Semiconductor devices - Mechanical and climatic test methods - Part 24: Accelerated moisture resistance - Unbiased HAST

German title: Halbleiterbauelemente - Mechanische und klimatische Prüfverfahren - Teil 24: Beschleunigte Verfahren für Feuchtebeständigkeit - Hochbeschleunigende Wirkung (HAST) ohne elektrische Beanspruchung
Publication date: 2005-11
Original language: English, French
Pages: 28

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