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IEC 60749-29:2003-11

Semiconductor devices - Mechanical and climatic test methods - Part 29: Latch-up test

German title
Halbleiterbauelemente - Mechanische und klimatische Prüfverfahren - Teil 29: Latch-up-Prüfung
Publication date
2003-11
Accessibility
Original language
English, French
Pages
50
Publication date
2003-11
Original language
English, French
Pages
50
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