In-Process DPMO and Estimated Yield for PCAs

Standard [CURRENT]

IPC 9261A:2007-01-02

In-Process DPMO and Estimated Yield for PCAs

Publication date
2007-01-02
Original language
English
Pages
12

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Publication date
2007-01-02
Original language
English
Pages
12
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Short description

To align with IPC-7912A for end item DPMO, this document defines consistent methodologies for computation of in-process defects per million opportunities (DPMO) metrics for any evaluation stage in the assembly process. It is intended for use in measuring in-process assembly steps rather than end product determination. Calculation of completed item DPMO is addressed in IPC-7912A. A guide to defect categorization is provided that can serve as a base for summarizing and reporting in-process defects when used with J-STD-001 and IPC-A-610. It can also be used to develop process step estimated yield - the expected percentage of assemblies with no defects for a particular process step or combined process steps, based on historical defect rates. 12 pages. Released October 2006.
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