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Technical rule [CURRENT]

DIN SPEC 52407:2015-03

Nanotechnologies - Methods for preparation and assessment for particle measurements with atomic force microscopy (AFM) and transmission scanning electron microscopy (TSEM)

German title
Nanotechnologien - Methoden zur Präparation und Auswertung für Partikelmessungen mit Rasterkraftmikroskopie (AFM) und Rasterelektronenmikroskopie im Transmissionsmodus (TSEM)
Publication date
2015-03
Original language
German
Pages
23
Procedure
Technical report

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Publication date
2015-03
Original language
German
Pages
23
Procedure
Technical report
DOI
https://dx.doi.org/10.31030/2296172

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Content
ICS
07.120
DOI
https://dx.doi.org/10.31030/2296172

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