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Vitreous and porcelain enamels - Low-voltage test for detecting and locating defects on profiled surfaces - Slurry test

Standard [WITHDRAWN]

DIN 51179:2014-09

Vitreous and porcelain enamels - Low-voltage test for detecting and locating defects on profiled surfaces - Slurry test

German title
Emails und Emaillierungen - Niederspannungsprüfung zum Nachweis und zur Lokalisierung von Fehlstellen auf profilierten Oberflächen - Schlickermethode
Publication date
2014-09
Original language
German
Pages
6

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Publication date
2014-09
Original language
German
Pages
6

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Overview

This standard specifies a low-voltage test method for detecting and locating defects (pores, cracks or slivers) in vitreous coatings on corrugated and/or ribbed profiles which extend up to the base material. The method is based on colour effects (optical method) and is suitable for the precise detection of defects and their exact position. It is applicable for uneven, more complicated shapes, for example corrugated and/or ribbed surfaces. This standard has been prepared by Working Committee NA 062-01-63 AA "Prüfungen von Emails und Emaillierungen" ("Testing of vitreous and porcelain enamels") at DIN Standards Committee Materials Testing (NMP).

Content

ICS

25.220.50
Replacement amendments

This document has been replaced by: DIN 51179:2016-08 .

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