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Vitreous and porcelain enamels - Low-voltage test for detecting and locating defects on profiled surfaces - Slurry test

Standard [WITHDRAWN]

DIN 51179:2016-08

Vitreous and porcelain enamels - Low-voltage test for detecting and locating defects on profiled surfaces - Slurry test

German title
Emails und Emaillierungen - Niederspannungsprüfung zum Nachweis und zur Lokalisierung von Fehlstellen auf profilierten Oberflächen - Schlickermethode
Publication date
2016-08
Original language
German
Pages
8

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Publication date
2016-08
Original language
German
Pages
8
DOI
https://dx.doi.org/10.31030/2518895

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Overview

This document specifies a low-voltage test method for detecting and locating defects (pores, cracks or pop-offs) that occur in enamel coatings of corrugated and/or undulated profiles and that extend down to the metal base. The method is based on colour effects (optical method) and is applicable to the precise detection of defects and their exact position. It can be used for non-flat, more profiled shapes such as corrugated or undulated surfaces. This standard has been prepared by Working Committee NA 062-01-63 AA "Prüfung von Emails und Emaillierungen" ("Testing of vitreous and porcelain enamels") at DIN Standards Committee Materials Testing (NMP).

Content

ICS

25.220.50

DOI

https://dx.doi.org/10.31030/2518895
Replacement amendments

This document replaces DIN 51179:2014-09 .

This document has been replaced by: DIN EN ISO 8289-2:2019-08 .

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