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Measurement of the complex permittivity for low-loss dielectric substrates balanced-type circular disk resonator method (IEC 63185:2025); German version EN IEC 63185:2025

Standard [NEW]

DIN EN IEC 63185:2026-02

Measurement of the complex permittivity for low-loss dielectric substrates balanced-type circular disk resonator method (IEC 63185:2025); German version EN IEC 63185:2025

German title
Messung der komplexen Dielektrizitätskonstante für verlustarme dielektrische Substrate nach dem symmetrischen Kreisscheibenresonatorverfahren (IEC 63185:2025); Deutsche Fassung EN IEC 63185:2025
Publication date
2026-02
Original language
German
Pages
14

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Publication date
2026-02
Original language
German
Pages
14
DOI
https://dx.doi.org/10.31030/3654599

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ICS

17.220.20

DOI

https://dx.doi.org/10.31030/3654599
Replacement amendments

This document replaces DIN EN IEC 63185:2022-10 .

Document timeline
CURRENT STANDARD
2026-02 - 2026-02

Standard [NEW]

DIN EN IEC 63185:2026-02
WITHDRAWN
2022-10 - 2026-02

Standard [WITHDRAWN]

DIN EN IEC 63185:2022-10
2025-03 - 2026-02

Draft standard [WITHDRAWN]

DIN EN IEC 63185:2025-03

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