DIN EN IEC 63185:2026-02

This document relates to a measurement method for complex permittivity of dielectric substrates at microwave and millimeter-wave frequencies. This method has been developed to evaluate the dielectric properties of low-loss materials used in microwave and millimeter-wave circuits and devices. It uses higher-order modes of a balanced-type circular disk resonator and provides broadband measurements of dielectric substrates by using one resonator, where the effect of excitation holes and that of fringing fields are taken into account accurately on the basis of the mode-matching analysis. This document covers the fundamentals of measurement, a description of the measurement setup, calibration, and the performance and evaluation of the measurement. There are no restrictions on the scope of application of this document. The standard differs from DIN EN IEC 63185:2022-10 as follows: a a) the upper limit of the applicable frequency range has been extended from 110 GHz to 170 GHz; b) circular disk resonators used for the measurements now include one with waveguide interfaces; c) in calculating the complex permittivity from the measured resonant properties, the fringing fields are now accurately taken into account based on the mode-matching analysis. Application of the standard increases investment security for manufacturers and users and provides testing laboratories and manufacturers with defined specifications for testing.