Microbeam analysis - Guidelines for orientation measurement using electron backscatter diffraction (ISO 24173:2024)

Standard [CURRENT]

DIN ISO 24173:2025-11

Microbeam analysis - Guidelines for orientation measurement using electron backscatter diffraction (ISO 24173:2024)

German title
Mikrobereichsanalyse - Leitfaden zur Messung der Orientierung mit Elektronenrückstreubeugung (ISO 24173:2024)
Publication date
2025-11
Accessibility
Original language
German
Pages
52

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Publication date
2025-11
Original language
German
Pages
52
DOI
https://dx.doi.org/10.31030/3633393
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Overview

This document gives guidance on how to generate reliable and reproducible crystallographic orientation measurements using electron backscatter diffraction (EBSD). It addresses the requirements for specimen preparation, instrument configuration, instrument calibration and data acquisition. The responsible national standardization committee is Working Committee NA 062-08-18 AA "Elektronenmikroskopie und Mikrobereichsanalyse" ("Electron microscopy and microbeam analysis") at DIN Standards Committee Materials Testing (NMP).

Content

ICS

71.040.50

DOI

https://dx.doi.org/10.31030/3633393
Replacement amendments

This document replaces DIN ISO 24173:2013-04 .

Cooperation at DIN

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