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IEC 60147-0:1966

Essential ratings and characteristics of semiconductor devices and general principles of measuring methods. Part 0: General and terminology

German title
Wesentliche Grenzwerte und Kennwerte von Halbleiterbauelementen und allgemeine Grundsätze für Meßverfahren; Teil 0: Allgemeines und Terminologie
Publication date
1966
Original language
English, French
Pages
57
Publication date
1966
Original language
English, French
Pages
57
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