Standard [CURRENT] Article is not orderable
IEC 60147-2B:1970
Essential ratings and characteristics of semiconductor devices and general principles of measuring methods. Part 2 : General principles of measuring methods.
- German title
- Wesentliche Grenzwerte und Kennwerte von Halbleiterbauelementen und allgemeine Grundsätze für Meßverfahren; Teil 2: Allgemeine Grundlagen für Meßverfahren; 2. Ergänzung
- Publication date
- 1970
- Original language
- English, French
- Pages
- 53
- Publication date
- 1970
- Original language
- English, French
- Pages
- 53
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