Standard [CURRENT] Article is not orderable
IEC 60749-30:2005-01
Semiconductor devices - Mechanical and climatic test methods - Part 30: Preconditioning of non-hermetic surface mount devices prior to reliability testing
- German title
- Halbleiterbauelemente - Mechanische und klimatische Prüfverfahren - Teil 30: Behandlung nicht hermetisch verkappter oberflächenmontierbarer Bauelemente vor Zuverlässigkeitsprüfungen
- Publication date
- 2005-01
- Original language
- English, French
- Pages
- 36
- Publication date
- 2005-01
- Original language
- English, French
- Pages
- 36
Loading recommended items...
Product information on this site:
Quick delivery via download or delivery service
Buy securely with a credit card or pay upon receipt of invoice
All transactions are encrypted
Replacement amendments
This document has been modified by: IEC 60749-30 AMD 1:2011-05
Loading recommended items...