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IEC 60749-33:2004-03

Semiconductor devices - Mechanical and climatic test methods - Part 33: Accelerated moisture resistance - Unbiased autoclave

German title
Halbleiterbauelemente - Mechanische und klimatische Prüfverfahren - Teil 33: Beschleunigte Verfahren für Feuchtebeständigkeit - Autoclave ohne elektrische Beanspruchung
Publication date
2004-03
Original language
English
Pages
12
Publication date
2004-03
Original language
English
Pages
12
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