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Standard [CURRENT]

ASTM F 1192:2011

Standard Guide for the Measurement of Single Event Phenomena (SEP) Induced by Heavy Ion Irradiation of Semiconductor Devices

German title
Richtlinie für die Messung von Einzelereigniserscheinungen, die durch Schwerionenstrahlung von Halbleitergeräten induziert wurden
Publication date
2011 reapproved: 2018
Original language
English
Pages
11

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Publication date
2011 reapproved: 2018
Original language
English
Pages
11
DOI
https://dx.doi.org/10.1520/F1192-11R18

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ICS
31.080.01
DOI
https://dx.doi.org/10.1520/F1192-11R18
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