Standard
[CURRENT]
OEVE/OENORM EN 62047-2:2007-03-01
Semiconductor devices - Micro-electromechanical devices - Part 2: Tensile testing method of thin film materials (IEC 62047-2:2006)
- German title
- Halbleiterbauelemente - Bauteile der Mikrosystemtechnik - Teil 2: Prüfverfahren zur Zugbeanspruchung bei Dünnschicht-Werkstoffen (IEC 62047-2:2006)
- Publication date
-
2007-03-01
- Original language
-
German
- Pages
- 14
- Publication date
-
2007-03-01
- Original language
-
German
- Pages
- 14
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