Technical rule [WITHDRAWN]
DIN IEC/TS 62607-5-1:2016-07
DIN SPEC 42607-5-1:2016-07
Nanomanufacturing - Key control characteristics - Part 5-1: Thin-film organic/nano electronic devices - Carrier transport measurements (IEC/TS 62607-5-1:2014)
- German title
- Nanofertigung - Schlüsselmerkmale - Teil 5-1: Dünnschicht-Elektronikbauelemente aus organischen Nanomaterialien - Messungen des Ladungsträgertransports (IEC/TS 62607-5-1:2014)
- Publication date
- 2016-07
- Original language
- German
- Pages
- 14
- Procedure
- Pre-Standard
- Publication date
- 2016-07
- Original language
- German
- Pages
- 14
- Procedure
- Pre-Standard
- DOI
- https://dx.doi.org/10.31030/2408249
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This part of IEC 62607, which is a Technical Specification, provides a standardized sample structure for characterizing charge transport properties in thin-film organic/nano electronic devices and a format to report details of the structure which shall be provided with the measurement results. The standardized OTFT testing structure with a contact-area-limited doping can mitigate contact resistance and enable reliable measurement of the charge carrier mobility. The purpose of this standard is to provide test sample structures for determining the intrinsic charge transport properties of organic thin-film devices. The intention is to provide reliable materials information for OTFTs and to set guidelines for making test sample structures so that materials information is clear and consistent throughout the research community and industry.